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Browsing by Author BUDE, JD
Showing results 3 to 11 of 11
| Issue Date | Title | Author(s) | | 2004 | Drain disturb during CHISEL programming of NOR flash EEPROMs-physical mechanisms and impact of technological parameters | MAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD |
| 2003 | The effect of CHE and CHISEL programming operation on drain disturb in flash EEPROMs | NAIR, DR; MOHAPATRA, NR; MAHAPATRA, S; SHUKURI, S; BUDE, JD |
| 2004 | Effect of P/E cycling on drain disturb in flash EEPROMs under CHE and CHISEL operation | MAHAPATRA, S; NAIR, DR; MOHAPATRA, NR; SHUKURI, S; BUDE, JD |
| 2003 | Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs | MOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S; BUDE, JD |
| 2005 | Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operation | MAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD |
| 2005 | Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operation | NAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD |
| 2004 | Multi-level programming of NOR flash EEPROMs by CHISEL mechanism | NAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD |
| 2002 | Performance and reliability of high density flash EEPROMs under CHISEL programming operation | MAHAPATRA, S; SHUKURI, S; BUDE, JD |
| 2003 | Substrate bias effect on cycling induced performance degradation of flash EEPROMs | MAHAPATRA, S; SHUKURI, S; BUDE, JD |
Showing results 3 to 11 of 11
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