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Issue DateTitleAuthor(s)
2004Drain disturb during CHISEL programming of NOR flash EEPROMs-physical mechanisms and impact of technological parametersMAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD
2003The effect of CHE and CHISEL programming operation on drain disturb in flash EEPROMsNAIR, DR; MOHAPATRA, NR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2004Effect of P/E cycling on drain disturb in flash EEPROMs under CHE and CHISEL operationMAHAPATRA, S; NAIR, DR; MOHAPATRA, NR; SHUKURI, S; BUDE, JD
2003Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMsMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S; BUDE, JD
2005Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operationMAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD
2005Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operationNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2004Multi-level programming of NOR flash EEPROMs by CHISEL mechanismNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2002Performance and reliability of high density flash EEPROMs under CHISEL programming operationMAHAPATRA, S; SHUKURI, S; BUDE, JD
2003Substrate bias effect on cycling induced performance degradation of flash EEPROMsMAHAPATRA, S; SHUKURI, S; BUDE, JD
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