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Issue Date	Title	Author(s)
1998	Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices	BROZEK, T; RAMGOPAL RAO, V; SRIDHARAN, A; WERKING, JD; CHAN, YD; VISWANATHAN, CR
1998	Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs	RAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR

Showing results 1 to 2 of 2