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Browsing by Author BHAT, N

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Issue Date	Title	Author(s)
2006	Analytical modeling of CMOS circuit delay distribution due to concurrent variations in multiple processes	HARISH, BP; BHAT, N; PATIL, MB
1992	Interface-state generation under radiation and high-field stressing in reoxidized nitrided oxide MOS capacitors	VASI, J; BHAT, N
2007	On a generalized framework for modeling the effects of process variations on circuit delay performance using response surface methodology	HARISH, BP; BHAT, N; PATIL, MB

Showing results 1 to 3 of 3