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Issue DateTitleAuthor(s)
2006Interface-trap driven NBTI for ultrathin (EOT similar to 12A) plasma and thermal nitrided oxynitridesGUPTA, G; MAHAPATRA, S; MADHAV, LL; VARGHESE, D; AHMED, K; NOURI, F
2005On the dispersive versus arrhenius temperature activation of nbti time evolution in plasma nitrided gate oxides: measurements, theory, and implicationsVARGHESE, D; SAHA, D; MAHAPATRA, S; AHMED, K; NOURI, F; ALAM, M
2007Physical mechanism and gate insulator material dependence of generation and recovery of negative-bias temperature instability in p-MOSFETsVARGHESE, D; GUPTA, G; LAKKIMSETTI, LM; SAHA, D; AHMED, K; NOURI, F; MAHAPATRA, S
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